Synchrotron X-ray diffraction computed tomography (XRD-CT) is a marriage between powder diffraction and computed tomography using a “pencil” beam approach. The spatially-resolved signals obtained with XRD-CT can reveal information that would otherwise be lost in bulk measurements, which opens up new possibilities in functional material characterization.
In this webinar, our research scientist Dr. Antony Vamvakeros will present results from key case studies where he and the team have applied XRD-CT to track the evolving solid-state chemistry of complex functional materials and devices under operating conditions. The webinar will also focus on the recent technical advances in data acquisition, treatment and handling strategies, as well as bottlenecks/limitations of the technique and the potential routes to overcome them.
For more information and to register for the webinar visit – https://register.gotowebinar.com/register/1134998773191322123?source=Social%20Media