Tag Archive for: X-ray scattering

Finden are pleased to be named as external service providers to the TEESMAT platform

Finden are pleased to be named as external service providers to the TEESMAT platform (https://www.teesmat.eu/about-us/), “a comprehensive response to the critical bottlenecks faced by EU stakeholders in the field of electrochemical energy storage materials. It leverages EU know-how & expertise from 11 countries and facilitates access to physical facilities, usable data, and industrially relevant services based […]

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New solution to the parallax problem in X-ray scattering/diffraction experiments

Our scientists’ new work on finding a solution to the parallax problem in X-ray scattering/diffraction experiments has been published in a new paper, “DLSR: a solution to the parallax artefact in X‐ray diffraction computed tomography data,” published in the Journal of Applied Crystallography. The work was performed in collaboration with the creator of the TOPAS software […]

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