Tag Archive for: X-ray scattering

Finden are pleased to be named as external service providers to the TEESMAT platform

Finden are pleased to be named as external service providers to the TEESMAT platform (https://www.teesmat.eu/about-us/), “a comprehensive response to the critical bottlenecks faced by EU stakeholders in the field of electrochemical energy storage materials. It leverages EU know-how & expertise from 11 countries and facilitates access to physical facilities, usable data, and industrially relevant services based […]

Read more

New solution to the parallax problem in X-ray scattering/diffraction experiments

Our scientists’ new work on finding a solution to the parallax problem in X-ray scattering/diffraction experiments has been published in a new paper, “DLSR: a solution to the parallax artefact in X‐ray diffraction computed tomography data,” published in the Journal of Applied Crystallography. The work was performed in collaboration with the creator of the TOPAS software […]

Read more
Privacy Overview
Finden

This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.

Strictly Necessary Cookies

Strictly Necessary Cookie should be enabled at all times so that we can save your preferences for cookie settings.

Analytics

This website uses Google Analytics to collect anonymous information such as the number of visitors to the site, and the most popular pages.

Keeping this cookie enabled helps us to improve our website.

Powered by  GDPR Cookie Compliance